For some DUT with long test cycle time or with complex test conditions, we provide Multi-Station -One-Turntable solution. 

The solution has several advantages：

l  Some DUT testing conditions is complex, such as include the button test, visual inspection and so on. Those test may have separate mechanical structure to support which may cause mechanical interference. Some other DUT may have high voltage detection and normal functional detection to use the same test points, which may cause electrical interference or potential safety hazard. The turntable solution can decompose the process to solve the problems, and ensure the test coverage and test reliability;

l  Because the product has been running on the turntable, it reduces the transfer labor between multi station and avoid risk of the product crash during transferring;

l  Between steps, tester is able to use the ‘Time Division Multiplex Access’ rule to share the test instruments. It is a good way to optimizing tester BOM cost.

l  Between steps on turntable, they are running in parallel to reduce tester cycle time. The final test time is only the maximum single step time + one rotation time;

l  It is able to be upgraded to ‘IN-LINE’ solutions testing by adding cache trays.

This is a demo of a tester with 5 test steps and one backup step.

For more information please contact: 020-82108945-8002